Fix unreferenced errors with mingw compiler and unit tests
parent
5a25d50168
commit
78545b9509
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@ -169,7 +169,6 @@ void action_function(keyrecord_t *record, uint8_t id, uint8_t opt)
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}
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}
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// translates key to keycode
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// translates key to keycode
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__attribute__ ((weak))
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uint16_t keymap_key_to_keycode(uint8_t layer, keypos_t key)
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uint16_t keymap_key_to_keycode(uint8_t layer, keypos_t key)
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{
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{
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// Read entire word (16bits)
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// Read entire word (16bits)
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@ -41,3 +41,6 @@ const macro_t *action_get_macro(keyrecord_t *record, uint8_t id, uint8_t opt) {
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}
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}
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return MACRO_NONE;
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return MACRO_NONE;
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};
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};
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void action_function(keyrecord_t *record, uint8_t id, uint8_t opt) {
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}
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@ -58,3 +58,6 @@ void release_key(uint8_t col, uint8_t row) {
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void clear_all_keys(void) {
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void clear_all_keys(void) {
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memset(matrix, 0, sizeof(matrix));
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memset(matrix, 0, sizeof(matrix));
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}
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}
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void led_set(uint8_t usb_led) {
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}
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@ -44,8 +44,8 @@ void TestFixture::run_one_scan_loop() {
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advance_time(1);
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advance_time(1);
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}
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}
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void TestFixture::idle_for(uint time) {
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void TestFixture::idle_for(unsigned time) {
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for (uint i=0; i<time; i++) {
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for (unsigned i=0; i<time; i++) {
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run_one_scan_loop();
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run_one_scan_loop();
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}
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}
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}
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}
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@ -26,5 +26,5 @@ public:
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static void TearDownTestCase();
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static void TearDownTestCase();
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void run_one_scan_loop();
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void run_one_scan_loop();
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void idle_for(uint ms);
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void idle_for(unsigned ms);
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};
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};
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